{"id":6547,"date":"2024-08-26T08:40:15","date_gmt":"2024-08-26T08:40:15","guid":{"rendered":"https:\/\/csmb.hu-berlin.de\/beam\/?page_id=6547"},"modified":"2025-03-17T20:32:44","modified_gmt":"2025-03-17T20:32:44","slug":"contact","status":"publish","type":"page","link":"https:\/\/csmb.hu-berlin.de\/beam\/contact\/","title":{"rendered":"Methods"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"6547\" class=\"elementor elementor-6547\">\n\t\t\t\t<div class=\"elementor-element elementor-element-65105a1 e-flex e-con-boxed e-con e-parent\" data-id=\"65105a1\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-7fe106b elementor-widget elementor-widget-text-editor\" data-id=\"7fe106b\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p>Within BeAM a number of advanced microscopy techniques are available that are enabled by (scanning) transmission electron microscopes [(S)TEMs] and scanning probe microscopes [SPM]. For some techniques, there exists a dedicated instrument, and some techniques are available on multiple instruments, albeit with different parameters (e.g. spatial or spectral resolution).<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-569acb5 e-grid e-con-boxed e-con e-parent\" data-id=\"569acb5\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-034ecc5 elementor-widget elementor-widget-text-editor\" data-id=\"034ecc5\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p><strong>TEM Imaging<\/strong> illuminates the sample by a (nearly) plane electron wave and uses the microscope&#8217;s post-specimen optics to project an image onto the camera. A wide range of magnifications up to approx 106 is available, with the resolution reaching below 1 Angstrom. <a href=\"https:\/\/csmb.hu-berlin.de\/beam\/\">Further details &#8230;<\/a><\/p><p><strong>Instruments<\/strong>: JEOL JEM2200FS, JEOL ARM200, JEOL JEM2100cryo, JEOL F200cryo, TFS Talos200<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-71cf9ab elementor-widget elementor-widget-image\" data-id=\"71cf9ab\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"788\" height=\"756\" src=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/TEM-1.png\" class=\"attachment-large size-large wp-image-6871\" alt=\"\" srcset=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/TEM-1.png 788w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/TEM-1-300x288.png 300w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/TEM-1-768x737.png 768w\" sizes=\"(max-width: 788px) 100vw, 788px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-64cbf40 elementor-widget elementor-widget-image\" data-id=\"64cbf40\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"677\" height=\"675\" src=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/Ptycho.png\" class=\"attachment-large size-large wp-image-6869\" alt=\"Phaseshift induced by a monolayer of MoS2 as reconstructed by electron ptychography\" srcset=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/Ptycho.png 677w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/Ptycho-300x300.png 300w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/Ptycho-150x150.png 150w\" sizes=\"(max-width: 677px) 100vw, 677px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-957e329 elementor-widget elementor-widget-text-editor\" data-id=\"957e329\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p><strong>Scanning TEM techniques<\/strong> illuminates the sample with a focused electron beam that is scanned across the sample. A wide variety of signals can be acquired at each beam position, such as the number of transmitted electrons that impinge on a detector, X-rays generated by inelastic scattering, electron energy-loss spectrum (EELS), diffraction patterns, etc. <a href=\"https:\/\/csmb.hu-berlin.de\/beam\/\">Further details &#8230;<\/a><\/p><p><strong>Instruments<\/strong>: JEOL JEM200, JEOL F200cryo, TFS Talos, TFS Titan, TFS SpectraUltra, Nion HERMES, Zeiss GeminiSEM500<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-6879cb4 elementor-widget elementor-widget-text-editor\" data-id=\"6879cb4\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p><strong>Electron diffraction<\/strong> records electrons scattered by the sample in reciprocal space. This measurement can be performed just once, or for many beam positions and provides information about crystallography, strain, radial distribution functions, etc. <a href=\"https:\/\/csmb.hu-berlin.de\/beam\/\">Further information &#8230;<\/a><\/p><p>Instruments: JEOL JEM200, JEOL F200cryo, TFS Talos, TFS Titan, TFS SpectraUltra, Nion HERMES, Zeiss GeminiSEM500<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-063d55e elementor-widget elementor-widget-image\" data-id=\"063d55e\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"710\" height=\"430\" src=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/recCube1.gif\" class=\"attachment-large size-large wp-image-6878\" alt=\"3D reconstruction from a large-angle rocking-beam electron diffraction data set.\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-346c478 elementor-widget elementor-widget-image\" data-id=\"346c478\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"830\" src=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/dispersion_diamond-1024x830.png\" class=\"attachment-large size-large wp-image-6882\" alt=\"\" srcset=\"https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/dispersion_diamond-1024x830.png 1024w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/dispersion_diamond-300x243.png 300w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/dispersion_diamond-768x622.png 768w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/dispersion_diamond-1536x1245.png 1536w, https:\/\/csmb.hu-berlin.de\/beam\/wp-content\/uploads\/2025\/03\/dispersion_diamond.png 1555w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-1e90fea elementor-widget elementor-widget-text-editor\" data-id=\"1e90fea\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<p><strong>Electron Spectroscopy<\/strong> uses inelastic scattering of electrons by the sample, causing transmitted electrons to loose some of their energy (EELS) or gain energy by anihilating an excited state (typically phonons) of the sample (EEGS). Microscopes equipped with an EDX detetor can also detect characteristic X-rays that are generated when the electronic states relax after the excitation of an electron.\u00a0 <a href=\"https:\/\/csmb.hu-berlin.de\/beam\/\">Further information &#8230;<\/a><\/p><p>Instruments: Nion HERMES, TFS Spectra Ultra, JEL 2200FS, Talos, <\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Within BeAM a number of advanced microscopy techniques are available that are enabled by (scanning) transmission electron microscopes [(S)TEMs] and [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"site-sidebar-layout":"no-sidebar","site-content-layout":"","ast-site-content-layout":"full-width-container","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"disabled","ast-breadcrumbs-content":"","ast-featured-img":"disabled","footer-sml-layout":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"default","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-6547","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/pages\/6547","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/comments?post=6547"}],"version-history":[{"count":49,"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/pages\/6547\/revisions"}],"predecessor-version":[{"id":6901,"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/pages\/6547\/revisions\/6901"}],"wp:attachment":[{"href":"https:\/\/csmb.hu-berlin.de\/beam\/wp-json\/wp\/v2\/media?parent=6547"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}